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Design and Testing of methodology for in-situ sample cleaning for low voltage electron microscopy
Rudolfová, Zdena ; Vávra,, Ivo (referee) ; Kolíbal, Miroslav (advisor)
This thesis concentrates on the methodology of semiconductor samples preparation for low voltage scanning electron microscopy. In the first part a detailed theory of sample imaging using electron beam and difference between classical scanning electron microscopy (SEM) and low voltage scanning electron microscopy (LVSEM) is described. It is given a description of a contrast formation in SEM and LVSEM and theories describing a contrast formation of differently doped semiconductors. The second part contains experimental data. The advantages and disadvantages of cleavage and focused ion beam (FIB) milling as sample preparation techniques are discussed. FIB was found as the best method for sample preparation for the analysis of precisely defined location on the sample. It is necessary to use the lowest possible FIB accelerating voltage for final polishing, ideally 1 kV.
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Conception of a conical splitter for wood
Stejskal, Jan ; Pokorný, Přemysl (referee) ; Hloušek, David (advisor)
This bachelor thesis consists of an introductory research part and a structural draft of a conical wood splitter with typed technical parameters and maximal log length and width. The thesis contains computing and strength examination of chosen components and final evaluation of designed construction from the law standards viewpoint.
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Conception of a conical splitter for wood
Stejskal, Jan ; Pokorný, Přemysl (referee) ; Hloušek, David (advisor)
This bachelor thesis consists of an introductory research part and a structural draft of a conical wood splitter with typed technical parameters and maximal log length and width. The thesis contains computing and strength examination of chosen components and final evaluation of designed construction from the law standards viewpoint.
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Design and Testing of methodology for in-situ sample cleaning for low voltage electron microscopy
Rudolfová, Zdena ; Vávra,, Ivo (referee) ; Kolíbal, Miroslav (advisor)
This thesis concentrates on the methodology of semiconductor samples preparation for low voltage scanning electron microscopy. In the first part a detailed theory of sample imaging using electron beam and difference between classical scanning electron microscopy (SEM) and low voltage scanning electron microscopy (LVSEM) is described. It is given a description of a contrast formation in SEM and LVSEM and theories describing a contrast formation of differently doped semiconductors. The second part contains experimental data. The advantages and disadvantages of cleavage and focused ion beam (FIB) milling as sample preparation techniques are discussed. FIB was found as the best method for sample preparation for the analysis of precisely defined location on the sample. It is necessary to use the lowest possible FIB accelerating voltage for final polishing, ideally 1 kV.
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